However, XPS data require thorough analysis using a dedicated software. Nowadays XPS has become a standard technique for the characterization of solid surfaces.
Instructor: Dmitry Zemlyanov, PhD, Senior Surface Science Application Scientist, Birck Nanotechnology Center, Purdue UniversityĢ) XPS Lite Workshop Introduction to CasaXPS ( ), January 23-24, 9:00 AM - BRK 1001.Ĭourse Description: XPS is widely used to determine the chemical composition of a surface (element concentrations, chemical states, lateral and depth distributions, etc.). The quantification of the XPS data will be discussed in detail (thickness calculation, coverage, atomic percentage, etc.) The course will teach how and what information can be provided by XPS.
It is a good practice to have at least one trained student in each research group using or planning to use Surface Analysis Characterization tools.ġ) Introduction to XPS workshop - What you should know about X-ray photoelectron spectroscopy ( ), January 16-17, 2018 9:00 AM - BRK 1001.Ĭourse Description: XPS is widely used to determine the chemical composition of a surface (element concentrations, chemical states, lateral and depth distributions, etc.). Two XPS related workshops will be held January, 2018.